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Main Authors: Paz-Martín, José, Schüller, Andreas, Apel, Marvin, Gago-Arias, Araceli, Pardo-Montero, Juan, Gómez, Faustino
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2512.14525
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author Paz-Martín, José
Schüller, Andreas
Apel, Marvin
Gago-Arias, Araceli
Pardo-Montero, Juan
Gómez, Faustino
author_facet Paz-Martín, José
Schüller, Andreas
Apel, Marvin
Gago-Arias, Araceli
Pardo-Montero, Juan
Gómez, Faustino
contents Background: Commercially available ionization chambers (ICs) exposed to ultra-high dose per pulse (UHDP) exhibit deviations from a linear dose response due to volume recombination. Simulation models have been developed to describe the charge collection efficiency (CCE) but focused on parallel-plate ICs. This study aims to measure and simulate the CCE and polarity effect of thimble ICs in UHDP. Methods: The response of two PinPoint3D T31022 (PP3D) and two PinPoint T31023 (PP) ICs was investigated experimentally at the national metrology institute of Germany (PTB). The ICs were irradiated using the UHDP reference electron beam with dose per pulse up to 9.3 Gy for different voltages. A novel finite element code capable of simulating 1D and 2D geometries was developed. Results: Thimble ICs exhibit a pronounced polarization effect when irradiated with UHDP. When the sign of the collected charge is negative, the CCE is larger than when it is positive. The major contribution to the polarity effect can be attributed to the polarity-dependent charge transport and recombination. Experimental and simulated CCE (polarity effect correction factor) agrees within 1.4 % (7.0 %) and 1.6 % (3.2 %) for the PP3D and PP ICs, respectively. The CCE of parallel-plate and thimble ICs is related through a geometrical rule. Conclusions: The PP IC shows greater CCE due to its smaller external radius. The numerical model is able to satisfactory reproduce the actual CCE and polarity effect for these two chambers. At UHDP, thimble ICs should be used with caution due to their large polarity effect.
format Preprint
id arxiv_https___arxiv_org_abs_2512_14525
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Charge collection efficiency of thimble ionization chambers exposed to ultra-high dose per pulse
Paz-Martín, José
Schüller, Andreas
Apel, Marvin
Gago-Arias, Araceli
Pardo-Montero, Juan
Gómez, Faustino
Medical Physics
Background: Commercially available ionization chambers (ICs) exposed to ultra-high dose per pulse (UHDP) exhibit deviations from a linear dose response due to volume recombination. Simulation models have been developed to describe the charge collection efficiency (CCE) but focused on parallel-plate ICs. This study aims to measure and simulate the CCE and polarity effect of thimble ICs in UHDP. Methods: The response of two PinPoint3D T31022 (PP3D) and two PinPoint T31023 (PP) ICs was investigated experimentally at the national metrology institute of Germany (PTB). The ICs were irradiated using the UHDP reference electron beam with dose per pulse up to 9.3 Gy for different voltages. A novel finite element code capable of simulating 1D and 2D geometries was developed. Results: Thimble ICs exhibit a pronounced polarization effect when irradiated with UHDP. When the sign of the collected charge is negative, the CCE is larger than when it is positive. The major contribution to the polarity effect can be attributed to the polarity-dependent charge transport and recombination. Experimental and simulated CCE (polarity effect correction factor) agrees within 1.4 % (7.0 %) and 1.6 % (3.2 %) for the PP3D and PP ICs, respectively. The CCE of parallel-plate and thimble ICs is related through a geometrical rule. Conclusions: The PP IC shows greater CCE due to its smaller external radius. The numerical model is able to satisfactory reproduce the actual CCE and polarity effect for these two chambers. At UHDP, thimble ICs should be used with caution due to their large polarity effect.
title Charge collection efficiency of thimble ionization chambers exposed to ultra-high dose per pulse
topic Medical Physics
url https://arxiv.org/abs/2512.14525