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Bibliographic Details
Main Authors: Marbey, Jonathan, Dreyer, Michael, Butera, R. E.
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2512.14962
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author Marbey, Jonathan
Dreyer, Michael
Butera, R. E.
author_facet Marbey, Jonathan
Dreyer, Michael
Butera, R. E.
contents We present a simple home made solution enabling in-situ RF reflectometry measurements with a millikelvin scanning tunneling microscope (mk-STM). The additions described below were made using RF best practices following similar detection schemes commonly employed in the quantum information science (QIS) community. Using a Niobium STM tip to form a superconductor-insulator-normal metal (SIN) tunnel junction, the evolution of coherence peaks at the SC-gap edge are carefully measured to characterize the RF losses and electron temperature. We further identify impedance matching as a crucial factor to achieve high sensitivity in the reflectometry by tuning the tip-sample capacitance as a function of approach distance. As a demonstration of this capability, we measure a 50x50 nm$^2$ area of island features that have been condensed onto the surface of a gold single crystal. Position dependent reflectometry losses allow us to image island sizes down to a total surface area of 5 nm$^2$ given our current sensitivity.
format Preprint
id arxiv_https___arxiv_org_abs_2512_14962
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Adding Radio Frequency Capabilities to a millikelvin Scanning Tunneling Microscope
Marbey, Jonathan
Dreyer, Michael
Butera, R. E.
Instrumentation and Detectors
We present a simple home made solution enabling in-situ RF reflectometry measurements with a millikelvin scanning tunneling microscope (mk-STM). The additions described below were made using RF best practices following similar detection schemes commonly employed in the quantum information science (QIS) community. Using a Niobium STM tip to form a superconductor-insulator-normal metal (SIN) tunnel junction, the evolution of coherence peaks at the SC-gap edge are carefully measured to characterize the RF losses and electron temperature. We further identify impedance matching as a crucial factor to achieve high sensitivity in the reflectometry by tuning the tip-sample capacitance as a function of approach distance. As a demonstration of this capability, we measure a 50x50 nm$^2$ area of island features that have been condensed onto the surface of a gold single crystal. Position dependent reflectometry losses allow us to image island sizes down to a total surface area of 5 nm$^2$ given our current sensitivity.
title Adding Radio Frequency Capabilities to a millikelvin Scanning Tunneling Microscope
topic Instrumentation and Detectors
url https://arxiv.org/abs/2512.14962