Pulse-Mode Operation and Reliability of BEOL-Compatible Ferroelectric Non-Volatile Capacitive Memories with Amorphous Oxide Semiconductor Channels

Fuente: arXiv
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Bibliographic Details
Main Authors: Lee, Junmo, Zhang, Chengyang, Kim, Tae-Hyeon, Datta, Suman, Yu, Shimeng
Format: Preprint
Published: 2025
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