meval: A Statistical Toolbox for Fine-Grained Model Performance Analysis

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sutariya, Dishantkumar, Petersen, Eike
Format:	Preprint
Published:	2025
Subjects:	Machine Learning Applications Methodology
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.17409