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Bibliographic Details
Main Authors: Dollfus, Philippe, Saint-Martin, Jérôme, Helleboid, Rémi, Cazimajou, Thibauld, Pilotto, Alessandro, Bournel, Arnaud, Rideau, Denis, Pala, Marco
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2512.17818
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author Dollfus, Philippe
Saint-Martin, Jérôme
Helleboid, Rémi
Cazimajou, Thibauld
Pilotto, Alessandro
Bournel, Arnaud
Rideau, Denis
Pala, Marco
author_facet Dollfus, Philippe
Saint-Martin, Jérôme
Helleboid, Rémi
Cazimajou, Thibauld
Pilotto, Alessandro
Bournel, Arnaud
Rideau, Denis
Pala, Marco
contents Si- and Ge-based single-photon-avalanche-diodes (SPAD) are investigated by using self-consistent 3D Monte Carlo simulation, in a mixed-mode approach including the presence of a passive quenching circuit. This approach of transport allows us to capture all stochastic features of carrier transport and SPAD operation, not only for the avalanche triggering but also for the quenching process. Beyond the comparison of Si and Ge devices, we show in particular the strong inverse correlation between avalanche and quenching probabilities when tuning the bias voltage, which highlights the importance to find a tradeoff between these two probabilities for the optimization of SPAD operation.
format Preprint
id arxiv_https___arxiv_org_abs_2512_17818
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Quenching statistics in Si and Ge SPADs using particle Monte Carlo simulation
Dollfus, Philippe
Saint-Martin, Jérôme
Helleboid, Rémi
Cazimajou, Thibauld
Pilotto, Alessandro
Bournel, Arnaud
Rideau, Denis
Pala, Marco
Other Condensed Matter
I.6.8; J.6
Si- and Ge-based single-photon-avalanche-diodes (SPAD) are investigated by using self-consistent 3D Monte Carlo simulation, in a mixed-mode approach including the presence of a passive quenching circuit. This approach of transport allows us to capture all stochastic features of carrier transport and SPAD operation, not only for the avalanche triggering but also for the quenching process. Beyond the comparison of Si and Ge devices, we show in particular the strong inverse correlation between avalanche and quenching probabilities when tuning the bias voltage, which highlights the importance to find a tradeoff between these two probabilities for the optimization of SPAD operation.
title Quenching statistics in Si and Ge SPADs using particle Monte Carlo simulation
topic Other Condensed Matter
I.6.8; J.6
url https://arxiv.org/abs/2512.17818