The Choice of Line Lengths in Multiline Thru-Reflect-Line Calibration
Fuente:
arXiv
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| Autores principales: | , , |
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| Formato: | Preprint |
| Publicado: |
2025
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| Acceso en línea: | |
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| _version_ | 1866917551643033600 |
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| author | Hatab, Ziad Gadringer, Michael Bösch, Wolfgang |
| author_facet | Hatab, Ziad Gadringer, Michael Bösch, Wolfgang |
| contents | This paper presents an analysis and rigorous procedure for determining the optimal lengths of line standards in multiline thru-reflect-line (TRL) calibration of vector network analyzers (VNAs). The solution is obtained through nonlinear constrained optimization of the eigenvalue problem in multiline TRL calibration. Additionally, we propose a simplified approach for near-optimal length selection based on predefined sparse rulers. Alongside the length calculation, we discuss the required number of lines to meet bandwidth requirements. The proposed methods are validated through measurements of multiple multiline TRL calibration kits on printed circuit boards of different materials and stackups, covering frequencies up to 150 GHz. A measurement-based Monte Carlo uncertainty analysis, using error boxes derived from impedance standard substrate measurements, demonstrates that the proposed line lengths distribute calibration uncertainty more evenly across lines compared to a commercial calibration kit. Practical examples are provided for various applications, including lossy and dispersive lines, as well as banded solutions for waveguides. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2512_18641 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | The Choice of Line Lengths in Multiline Thru-Reflect-Line Calibration Hatab, Ziad Gadringer, Michael Bösch, Wolfgang Signal Processing Instrumentation and Detectors This paper presents an analysis and rigorous procedure for determining the optimal lengths of line standards in multiline thru-reflect-line (TRL) calibration of vector network analyzers (VNAs). The solution is obtained through nonlinear constrained optimization of the eigenvalue problem in multiline TRL calibration. Additionally, we propose a simplified approach for near-optimal length selection based on predefined sparse rulers. Alongside the length calculation, we discuss the required number of lines to meet bandwidth requirements. The proposed methods are validated through measurements of multiple multiline TRL calibration kits on printed circuit boards of different materials and stackups, covering frequencies up to 150 GHz. A measurement-based Monte Carlo uncertainty analysis, using error boxes derived from impedance standard substrate measurements, demonstrates that the proposed line lengths distribute calibration uncertainty more evenly across lines compared to a commercial calibration kit. Practical examples are provided for various applications, including lossy and dispersive lines, as well as banded solutions for waveguides. |
| title | The Choice of Line Lengths in Multiline Thru-Reflect-Line Calibration |
| topic | Signal Processing Instrumentation and Detectors |
| url | https://arxiv.org/abs/2512.18641 |