Gap-free Information Transfer in 4D-STEM via Fusion of Complementary Scattering Channels
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| Autores principales: | , , , , , , , , , , , , , , |
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| Formato: | Preprint |
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2025
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| author | You, Shengbo Varnavides, Georgios Khavnekar, Sagar Palatkin, Nikita Shao, Sihan Wu, Mingjian Stroppa, Daniel Chernikova, Darya Zhu, Baixu Egoavil, Ricardo Vespucci, Stefano Ye, Xingchen Schur, Florian K. M. Spiecker, Erdmann Pelz, Philipp |
| author_facet | You, Shengbo Varnavides, Georgios Khavnekar, Sagar Palatkin, Nikita Shao, Sihan Wu, Mingjian Stroppa, Daniel Chernikova, Darya Zhu, Baixu Egoavil, Ricardo Vespucci, Stefano Ye, Xingchen Schur, Florian K. M. Spiecker, Erdmann Pelz, Philipp |
| contents | Linear phase-contrast scanning transmission electron microscopy (STEM) techniques compatible with high-throughput 4D-STEM acquisition are widely used to enhance phase contrast in weakly scattering and beam-sensitive materials. In these modalities, contrast transfer is often suppressed at low spatial frequencies, resulting in a characteristic contrast gap that limits quantitative imaging. Approaches that retain low-frequency phase contrast exist but typically require substantially increased experimental complexity, restricting routine use. Dark-field STEM imaging captures this missing low-frequency information through electrons scattered outside the bright-field disk, but discards a large fraction of the scattered signal and is therefore dose-inefficient. Fused Full-field STEM (FF-STEM) is introduced as a 4D-STEM imaging modality that overcomes this limitation by combining ptychographic phase reconstruction with tilt-corrected dark-field imaging within a single acquisition. Bright-field data are used to estimate probe aberrations and reconstruct a high-resolution phase image, while dark-field data provide complementary low-frequency contrast. The two channels are optimally fused in Fourier space using minimum-variance weighting based on the spectral signal-to-noise ratio, yielding transfer-gap-free images with high contrast and quantitative fidelity. FF-STEM preserves the upsampling and depth-sectioning capabilities of ptychography, adds robust low-frequency contrast characteristic of dark-field imaging, and enables dose-efficient, near-real-time reconstruction. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2512_19460 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Gap-free Information Transfer in 4D-STEM via Fusion of Complementary Scattering Channels You, Shengbo Varnavides, Georgios Khavnekar, Sagar Palatkin, Nikita Shao, Sihan Wu, Mingjian Stroppa, Daniel Chernikova, Darya Zhu, Baixu Egoavil, Ricardo Vespucci, Stefano Ye, Xingchen Schur, Florian K. M. Spiecker, Erdmann Pelz, Philipp Optics Materials Science Computational Physics Linear phase-contrast scanning transmission electron microscopy (STEM) techniques compatible with high-throughput 4D-STEM acquisition are widely used to enhance phase contrast in weakly scattering and beam-sensitive materials. In these modalities, contrast transfer is often suppressed at low spatial frequencies, resulting in a characteristic contrast gap that limits quantitative imaging. Approaches that retain low-frequency phase contrast exist but typically require substantially increased experimental complexity, restricting routine use. Dark-field STEM imaging captures this missing low-frequency information through electrons scattered outside the bright-field disk, but discards a large fraction of the scattered signal and is therefore dose-inefficient. Fused Full-field STEM (FF-STEM) is introduced as a 4D-STEM imaging modality that overcomes this limitation by combining ptychographic phase reconstruction with tilt-corrected dark-field imaging within a single acquisition. Bright-field data are used to estimate probe aberrations and reconstruct a high-resolution phase image, while dark-field data provide complementary low-frequency contrast. The two channels are optimally fused in Fourier space using minimum-variance weighting based on the spectral signal-to-noise ratio, yielding transfer-gap-free images with high contrast and quantitative fidelity. FF-STEM preserves the upsampling and depth-sectioning capabilities of ptychography, adds robust low-frequency contrast characteristic of dark-field imaging, and enables dose-efficient, near-real-time reconstruction. |
| title | Gap-free Information Transfer in 4D-STEM via Fusion of Complementary Scattering Channels |
| topic | Optics Materials Science Computational Physics |
| url | https://arxiv.org/abs/2512.19460 |