Exponential-to-polynomial scaling of measurement overhead in circuit knitting via quantum tomography

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Harada, Hiroyuki, Wada, Kaito, Yamamoto, Naoki, Endo, Suguru
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items