Quantum Imaging of Birefringent Samples using Hong-Ou-Mandel Interference
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arXiv
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| Autores principales: | , , , |
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| Formato: | Preprint |
| Publicado: |
2025
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| _version_ | 1866915691290951680 |
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| author | Gonçalves, Carolina Ferreira, Tiago D. Monteiro, Catarina S. Silva, Nuno A. |
| author_facet | Gonçalves, Carolina Ferreira, Tiago D. Monteiro, Catarina S. Silva, Nuno A. |
| contents | Two-photon interference in a Hong-Ou-Mandel (HOM) interferometer can be used as a quantum sensing mechanism due to the sensitivity of the interference dip to perturbations of the photon indistinguishability. In particular, recent works have generalized this concept to microscopy setups, but the sensitivity to optical path differences constrains its application to samples with thickness variation typically below a few micrometers if tracking changes in the coincidences at a fixed delay. Extending the concept to polarization microscopy and circumventing this limitation, this manuscript explores the use of a narrowband photon pair source with coherence length >1 mm to broaden the HOM dip. Thus, realistic sample-thickness variations introduce negligible temporal distinguishability, and changes in coincidence rate at the dip centre are then dominated by sample-induced polarization effects. To compute the polarization rotation, we develop a statistical model for the interferometer, derive the Fisher information, and establish a maximum-likelihood estimator for the local fast-axis angle. Recording dip and baseline frames at each sample position via raster scanning, the experimental results validate the framework, agreeing with classical polarized-intensity images while demonstrating operation at a maximum-precision regime and insensitiveness to layer thickness. Overall, the approach enclosed provides a quantum-based quantitative imaging of birefringent structures, which can motivate further advantageous applications, including enhanced signal-to-noise ratio and lower damage imaging of photosensitive samples. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2512_19637 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Quantum Imaging of Birefringent Samples using Hong-Ou-Mandel Interference Gonçalves, Carolina Ferreira, Tiago D. Monteiro, Catarina S. Silva, Nuno A. Quantum Physics Optics Two-photon interference in a Hong-Ou-Mandel (HOM) interferometer can be used as a quantum sensing mechanism due to the sensitivity of the interference dip to perturbations of the photon indistinguishability. In particular, recent works have generalized this concept to microscopy setups, but the sensitivity to optical path differences constrains its application to samples with thickness variation typically below a few micrometers if tracking changes in the coincidences at a fixed delay. Extending the concept to polarization microscopy and circumventing this limitation, this manuscript explores the use of a narrowband photon pair source with coherence length >1 mm to broaden the HOM dip. Thus, realistic sample-thickness variations introduce negligible temporal distinguishability, and changes in coincidence rate at the dip centre are then dominated by sample-induced polarization effects. To compute the polarization rotation, we develop a statistical model for the interferometer, derive the Fisher information, and establish a maximum-likelihood estimator for the local fast-axis angle. Recording dip and baseline frames at each sample position via raster scanning, the experimental results validate the framework, agreeing with classical polarized-intensity images while demonstrating operation at a maximum-precision regime and insensitiveness to layer thickness. Overall, the approach enclosed provides a quantum-based quantitative imaging of birefringent structures, which can motivate further advantageous applications, including enhanced signal-to-noise ratio and lower damage imaging of photosensitive samples. |
| title | Quantum Imaging of Birefringent Samples using Hong-Ou-Mandel Interference |
| topic | Quantum Physics Optics |
| url | https://arxiv.org/abs/2512.19637 |