Dynamic Imaging of Periodic Structures using Extreme Ultraviolet Scatterometry

Fuente: arXiv
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Autores principales: McBennett, Brendan, Tanksalvala, Michael, Nelson, Emma E., Culman, Theodore H., Li, Yunhao, Liu, Jiayi, Berk, Ethan, Beardo, Albert, Harford, James, Shaw, Justin, Kapteyn, Henry C., Murnane, Margaret M., Knobloch, Joshua L.
Formato: Preprint
Publicado: 2025
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author McBennett, Brendan
Tanksalvala, Michael
Nelson, Emma E.
Culman, Theodore H.
Li, Yunhao
Liu, Jiayi
Berk, Ethan
Beardo, Albert
Harford, James
Shaw, Justin
Kapteyn, Henry C.
Murnane, Margaret M.
Knobloch, Joshua L.
author_facet McBennett, Brendan
Tanksalvala, Michael
Nelson, Emma E.
Culman, Theodore H.
Li, Yunhao
Liu, Jiayi
Berk, Ethan
Beardo, Albert
Harford, James
Shaw, Justin
Kapteyn, Henry C.
Murnane, Margaret M.
Knobloch, Joshua L.
contents Dynamic scattering and imaging with coherent, ultrafast, extreme ultraviolet (EUV) light sources can resolve charge, phonon and spin processes on their intrinsic length and time scales. However, full field coherent diffraction imaging requires scanning of the sample combined with computational phase retrieval, making it challenging to quickly acquire a large series of dynamic frames. In this work, we demonstrate a technique for extracting dynamic 1D images of the average unit cell in a periodic sample from traditional EUV scatterometry data by analyzing the changing intensities of the far field diffracted orders. Starting from a system of equations relating small changes in far field diffraction to phase and amplitude perturbations at the sample plane, it is shown that under certain conditions, changes to the $n$th diffracted order map exclusively onto the $n$th Fourier component of the perturbation via a closed-form relation. We show through rigorous coupled-wave analysis simulations that our method can provide a good approximation even outside the scalar diffraction theory framework in which it is derived. Finally, we experimentally demonstrate this reconstruction method by exiting 1D nickel nanowires on a diamond substrate using an infrared laser pump pulse, and measuring their relaxation using a time-delayed EUV probe pulse, to visualize nanoscale phonon dynamics.
format Preprint
id arxiv_https___arxiv_org_abs_2512_19940
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Dynamic Imaging of Periodic Structures using Extreme Ultraviolet Scatterometry
McBennett, Brendan
Tanksalvala, Michael
Nelson, Emma E.
Culman, Theodore H.
Li, Yunhao
Liu, Jiayi
Berk, Ethan
Beardo, Albert
Harford, James
Shaw, Justin
Kapteyn, Henry C.
Murnane, Margaret M.
Knobloch, Joshua L.
Optics
Applied Physics
Dynamic scattering and imaging with coherent, ultrafast, extreme ultraviolet (EUV) light sources can resolve charge, phonon and spin processes on their intrinsic length and time scales. However, full field coherent diffraction imaging requires scanning of the sample combined with computational phase retrieval, making it challenging to quickly acquire a large series of dynamic frames. In this work, we demonstrate a technique for extracting dynamic 1D images of the average unit cell in a periodic sample from traditional EUV scatterometry data by analyzing the changing intensities of the far field diffracted orders. Starting from a system of equations relating small changes in far field diffraction to phase and amplitude perturbations at the sample plane, it is shown that under certain conditions, changes to the $n$th diffracted order map exclusively onto the $n$th Fourier component of the perturbation via a closed-form relation. We show through rigorous coupled-wave analysis simulations that our method can provide a good approximation even outside the scalar diffraction theory framework in which it is derived. Finally, we experimentally demonstrate this reconstruction method by exiting 1D nickel nanowires on a diamond substrate using an infrared laser pump pulse, and measuring their relaxation using a time-delayed EUV probe pulse, to visualize nanoscale phonon dynamics.
title Dynamic Imaging of Periodic Structures using Extreme Ultraviolet Scatterometry
topic Optics
Applied Physics
url https://arxiv.org/abs/2512.19940