Huang, Z., & Niu, Z. (2025). Semiparametric KSD test: Unifying score and distance-based approaches for goodness-of-fit testing.
Cita Chicago Style (17a ed.)Huang, Zhihan, y Ziang Niu. Semiparametric KSD Test: Unifying Score and Distance-based Approaches for Goodness-of-fit Testing. 2025.
Cita MLA (9a ed.)Huang, Zhihan, y Ziang Niu. Semiparametric KSD Test: Unifying Score and Distance-based Approaches for Goodness-of-fit Testing. 2025.
Precaución: Estas citas no son 100% exactas.