Electronic states at twist stacking faults in rhombohedral graphite

Fuente: arXiv
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Autores principales: Liu, Xiaoqian, Guan, Yifei, Yazyev, Oleg V.
Formato: Preprint
Publicado: 2025
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author Liu, Xiaoqian
Guan, Yifei
Yazyev, Oleg V.
author_facet Liu, Xiaoqian
Guan, Yifei
Yazyev, Oleg V.
contents Flat bands in graphitic materials emerged as a platform for realizing tunable correlated physics. As a nodal-line semimetal, rhombohedral graphite features flat drumhead surface states in the vicinity of the Dirac points, which carry a nontrivial topological charge. We present a comprehensive study on rhombohedral graphite with twist stacking faults. Using both the continuum models and the realistic tight-binding models, we show that the twist angle between the graphene layers can tune the interface states at such stacking faults. The evolution of interface states originates from the interplay between the moiré periodicity and Zak phase topology, predicting the occurrence of nearly flat bands throughout the moiré Brillouin zone. We further investigate the disorder-induced layer polarization and tunable Chern number for flat band, and characterize the relationship between the disorder strength and Chern number in twisted rhombohedral graphite.
format Preprint
id arxiv_https___arxiv_org_abs_2512_20493
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Electronic states at twist stacking faults in rhombohedral graphite
Liu, Xiaoqian
Guan, Yifei
Yazyev, Oleg V.
Mesoscale and Nanoscale Physics
Materials Science
Flat bands in graphitic materials emerged as a platform for realizing tunable correlated physics. As a nodal-line semimetal, rhombohedral graphite features flat drumhead surface states in the vicinity of the Dirac points, which carry a nontrivial topological charge. We present a comprehensive study on rhombohedral graphite with twist stacking faults. Using both the continuum models and the realistic tight-binding models, we show that the twist angle between the graphene layers can tune the interface states at such stacking faults. The evolution of interface states originates from the interplay between the moiré periodicity and Zak phase topology, predicting the occurrence of nearly flat bands throughout the moiré Brillouin zone. We further investigate the disorder-induced layer polarization and tunable Chern number for flat band, and characterize the relationship between the disorder strength and Chern number in twisted rhombohedral graphite.
title Electronic states at twist stacking faults in rhombohedral graphite
topic Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2512.20493