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A scanning probe microscopy approach for identifying defects in aluminum oxide

Fuente: arXiv

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Bibliographic Details
Main Authors:	Tom, Leah, Krebs, Zachary J., Varley, Joel B., Joseph, E. S., Behn, Wyatt A., Eriksson, M. A., Ray, Keith G., Lordi, Vincenzo, Coppersmith, S. N., Brar, Victor W., Friesen, Mark
Format:	Preprint
Published:	2025
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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