Liu, J., Teng, Y., Chen, Y., Wang, Y., Luo, C., Yin, J., . . . Shi, F. (2025). Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature.
Citazione stile Chigago Style (17a edizione)Liu, Jinpeng, et al. Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature. 2025.
Citatione MLA (9a ed.)Liu, Jinpeng, et al. Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature. 2025.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.