Liu, J., Teng, Y., Chen, Y., Wang, Y., Luo, C., Yin, J., . . . Shi, F. (2025). Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature.
Cita Chicago Style (17a ed.)Liu, Jinpeng, et al. Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature. 2025.
Cita MLA (9a ed.)Liu, Jinpeng, et al. Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature. 2025.
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