Liu, J., Teng, Y., Chen, Y., Wang, Y., Luo, C., Yin, J., . . . Shi, F. (2025). Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature.
Chicago Style (17th ed.) CitationLiu, Jinpeng, et al. Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature. 2025.
MLA (9th ed.) CitationLiu, Jinpeng, et al. Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature. 2025.
Warning: These citations may not always be 100% accurate.