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Quantum Noise Spectroscopy of Nanoscale Charge Defects in Silicon Carbide at Room Temperature

Fuente: arXiv
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Bibliographic Details
Main Authors: Liu, Jinpeng, Teng, Yuanhong, Chen, Yu, Wang, Yixuan, Luo, Chihang, Yin, Jun, Li, Hao, You, Lixing, Wang, Ya, Zhang, Qi, Shi, Fazhan
Format: Preprint
Published: 2025
Subjects:
Quantum Physics
Materials Science
Online Access:
Acceder al recurso
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