Temperature and crystallographic orientation dependence of the anisotropic magnetoresistance in epitaxial Fe65Co35 thin films
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| Main Authors: | , , , , , , , , , |
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| Format: | Preprint |
| Published: |
2025
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| _version_ | 1866914221971734528 |
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| author | Jalca, A. Paz Lozano, W. H. Painado Gonzalez-Chavez, D. E. Saba, L. Pérez-Morelo, D. Gómez, J. E. Butera, A. Espinoza, A. Gutarra Hilario, L. M. Leon Avilés-Félix, L. |
| author_facet | Jalca, A. Paz Lozano, W. H. Painado Gonzalez-Chavez, D. E. Saba, L. Pérez-Morelo, D. Gómez, J. E. Butera, A. Espinoza, A. Gutarra Hilario, L. M. Leon Avilés-Félix, L. |
| contents | In this work, we study the anisotropic magnetoresistance (AMR) behavior of [001] epitaxial Fe65Co35 thin films along different crystallographic directions as a function of temperature. The AMR ratio is found to strongly depend on the current orientation relative to the crystal axes, reaching 0.16 % and 0.10 % at room temperature when the current is applied along the magnetic hard and easy axes, respectively. Moreover, the AMR ratio decreases at different rates as the temperature is reduced to 80 K. The longitudinal and transverse magnetoresistance curves were fitted using the Stoner-Wohlfarth formalism to describe the magnetization reversal path and to extract the magnetic anisotropy constants. The fitted cubic and uniaxial anisotropy constants are Kc = -2.36 kJ/m3 and Ku = 2.18 kJ/m3, verifying the change in the cubic anisotropy compared to Fe-richer Fe100-xCox compositions. These results demonstrate that by tailoring the crystalline orientation and temperature dependence of AMR, epitaxial Fe65Co35 thin films can enable the design of magnetic sensors with tunable sensitivity. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2512_22590 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Temperature and crystallographic orientation dependence of the anisotropic magnetoresistance in epitaxial Fe65Co35 thin films Jalca, A. Paz Lozano, W. H. Painado Gonzalez-Chavez, D. E. Saba, L. Pérez-Morelo, D. Gómez, J. E. Butera, A. Espinoza, A. Gutarra Hilario, L. M. Leon Avilés-Félix, L. Materials Science In this work, we study the anisotropic magnetoresistance (AMR) behavior of [001] epitaxial Fe65Co35 thin films along different crystallographic directions as a function of temperature. The AMR ratio is found to strongly depend on the current orientation relative to the crystal axes, reaching 0.16 % and 0.10 % at room temperature when the current is applied along the magnetic hard and easy axes, respectively. Moreover, the AMR ratio decreases at different rates as the temperature is reduced to 80 K. The longitudinal and transverse magnetoresistance curves were fitted using the Stoner-Wohlfarth formalism to describe the magnetization reversal path and to extract the magnetic anisotropy constants. The fitted cubic and uniaxial anisotropy constants are Kc = -2.36 kJ/m3 and Ku = 2.18 kJ/m3, verifying the change in the cubic anisotropy compared to Fe-richer Fe100-xCox compositions. These results demonstrate that by tailoring the crystalline orientation and temperature dependence of AMR, epitaxial Fe65Co35 thin films can enable the design of magnetic sensors with tunable sensitivity. |
| title | Temperature and crystallographic orientation dependence of the anisotropic magnetoresistance in epitaxial Fe65Co35 thin films |
| topic | Materials Science |
| url | https://arxiv.org/abs/2512.22590 |