Real-time Observation of Thermal Surface Recovery in $SrVO_3$

Fuente: arXiv
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Autori principali: Cohen, Amit, Ludwick, Jonathan, Yahya, Ward, Baskin, Maria, Shoham, Lishai, Back, Tyson C., Kornblum, Lior
Natura: Preprint
Pubblicazione: 2025
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author Cohen, Amit
Ludwick, Jonathan
Yahya, Ward
Baskin, Maria
Shoham, Lishai
Back, Tyson C.
Kornblum, Lior
author_facet Cohen, Amit
Ludwick, Jonathan
Yahya, Ward
Baskin, Maria
Shoham, Lishai
Back, Tyson C.
Kornblum, Lior
contents $SrVO_3$ (SVO), a model correlated metal and a promising transparent conducting oxide, develops a several-nanometer-thick near-surface region (NSR), rich in $V^{5+}$ species under ambient conditions. This oxidized layer obscures the intrinsic correlated-metallic $V^{4+}$ character and limits both fundamental studies of the physics and the material's integration into electronic devices. Here, we demonstrate a direct and controllable approach for recovering the metallic SVO surface by thermally reducing the NSR under ultra-high vacuum. Real-time in-situ X-ray photoelectron spectroscopy (XPS) reveals a sharp transformation from a $V^{5+}$-dominated surface to mixed valence states, dominated by $V^{4+}$, and a recovery of its metallic character. Ex-situ X-ray diffraction (XRD), atomic force microscopy (AFM), and high-resolution scanning electron microscopy (HR-SEM) suggest that this transformation is accompanied by mass redistribution and partial oxygen loss, leading to nanoscale surface reorganization and modest lattice expansion. While thermodynamic considerations motivate evaluation of a $V_2O_5$ volatilization pathway, the combined experimental evidence instead points toward a predominantly structural surface reorganization. These findings establish a practical method for obtaining predominantly $V^{4+}$ SVO surfaces without protective capping layers, a capability that expands the utility of SVO for advanced spectroscopies, interface engineering, and oxide-electronics device integration.
format Preprint
id arxiv_https___arxiv_org_abs_2512_22843
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Real-time Observation of Thermal Surface Recovery in $SrVO_3$
Cohen, Amit
Ludwick, Jonathan
Yahya, Ward
Baskin, Maria
Shoham, Lishai
Back, Tyson C.
Kornblum, Lior
Materials Science
$SrVO_3$ (SVO), a model correlated metal and a promising transparent conducting oxide, develops a several-nanometer-thick near-surface region (NSR), rich in $V^{5+}$ species under ambient conditions. This oxidized layer obscures the intrinsic correlated-metallic $V^{4+}$ character and limits both fundamental studies of the physics and the material's integration into electronic devices. Here, we demonstrate a direct and controllable approach for recovering the metallic SVO surface by thermally reducing the NSR under ultra-high vacuum. Real-time in-situ X-ray photoelectron spectroscopy (XPS) reveals a sharp transformation from a $V^{5+}$-dominated surface to mixed valence states, dominated by $V^{4+}$, and a recovery of its metallic character. Ex-situ X-ray diffraction (XRD), atomic force microscopy (AFM), and high-resolution scanning electron microscopy (HR-SEM) suggest that this transformation is accompanied by mass redistribution and partial oxygen loss, leading to nanoscale surface reorganization and modest lattice expansion. While thermodynamic considerations motivate evaluation of a $V_2O_5$ volatilization pathway, the combined experimental evidence instead points toward a predominantly structural surface reorganization. These findings establish a practical method for obtaining predominantly $V^{4+}$ SVO surfaces without protective capping layers, a capability that expands the utility of SVO for advanced spectroscopies, interface engineering, and oxide-electronics device integration.
title Real-time Observation of Thermal Surface Recovery in $SrVO_3$
topic Materials Science
url https://arxiv.org/abs/2512.22843