DEFT: Differentiable Automatic Test Pattern Generation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Wei, Zou, Yang, Liang, Yixin, Moura, José, Blanton, Shawn
Format:	Preprint
Published:	2025
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2512.23746