Cover Image

Inverted-Mode Scanning Tunneling Microscopy for Atomically Precise Fabrication

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Barrera, Eduardo, Thanabalasingam, Bheeshmon, Addou, Rafik, Allis, Damian, Asani, Aly, Barton, Jeremy, Bernots, Tomass, Blue, Brandon, Bottomley, Adam, Cheng, Doreen, Choi, Byoung, Cowie, Megan, Deimert, Chris, Drew, Michael, Durand, Mathieu, Enright, Tyler, Freitas Jr., Robert A., Godfrey, Alan, Groome, Ryan, Guo, Si Yue, Haird, Sheldon, Hill, Aru, Huff, Taleana, Imperiale, Christian, Inayeh, Alex, Jeyachandra, Jerry, Jobes, Mark, Kennedy, Matthew, Kirby, Robert J., Krykunov, Mykhaylo, Lilak, Sam, Ma, Hadiya, Maahs, Adam, Mackie, Cameron J., MacLean, Oliver, Marshall, Michael, McCallum, Terry, Merkle, Ralph C., Morin, Mathieu, Myall, Jonathan, Ofitserov, Alexei, Ou, Sheena, Plumadore, Ryan, Powell, Adam, Prokopenko, Max, Rodriguez, Henry, Rohe, Sam, Sandoval, Luis, Savoie, Marc, Sayed-Akhmad, Khalil, Scheffel, Ben, Takatani, Tait, Therien, D. Alexander, Van Barr, Finley, Vobornik, Dusan, Wong, Janice, Wotton, Reid, Yamachika, Ryan, Yu, Cristina, Taucer, Marco
Format: Preprint
Published: 2025
Subjects:
Mesoscale and Nanoscale Physics
Online Access:
Acceder al recurso
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items