Transverse Photoresistivity from Photothermal Current Deflection in Metal Films
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arXiv
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| Main Authors: | , , , , , , , , |
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| Format: | Preprint |
| Published: |
2026
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| _version_ | 1866918273317076992 |
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| author | Sakrikar, Piyush Plisson, Vincent M. Grant, Cameron Rosenmerkel, Dylan Natale, Gabriel Geiwitz, Michael Ran, Ying Kempa, Krzysztof Burch, Kenneth S. |
| author_facet | Sakrikar, Piyush Plisson, Vincent M. Grant, Cameron Rosenmerkel, Dylan Natale, Gabriel Geiwitz, Michael Ran, Ying Kempa, Krzysztof Burch, Kenneth S. |
| contents | Quantum geometry in centrosymmetric systems has motivated the search for photocurrent responses beyond second order. In particular, electric field-induced nonlinear responses may also enable intrinsic polarization-sensitive optical detectors. Despite numerous efforts, clear methods are still needed to remove experimental artifacts, separating intrinsic from extrinsic effects, and disentangling linear responses from their higher-order counterparts. Here, we provide a systematic study of fabrication and measurement techniques to remove external artifacts in photoelectronic responses. This reveals a previously hidden photothermoelectric response in the transverse photoresistivity of symmetric thin films of simple metals. We identify its origin in thermal gradients producing current deflection and determine the device design and measurement parameters to minimize extrinsic effects that arise in photoinduced electronic responses. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2601_02340 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Transverse Photoresistivity from Photothermal Current Deflection in Metal Films Sakrikar, Piyush Plisson, Vincent M. Grant, Cameron Rosenmerkel, Dylan Natale, Gabriel Geiwitz, Michael Ran, Ying Kempa, Krzysztof Burch, Kenneth S. Materials Science Quantum geometry in centrosymmetric systems has motivated the search for photocurrent responses beyond second order. In particular, electric field-induced nonlinear responses may also enable intrinsic polarization-sensitive optical detectors. Despite numerous efforts, clear methods are still needed to remove experimental artifacts, separating intrinsic from extrinsic effects, and disentangling linear responses from their higher-order counterparts. Here, we provide a systematic study of fabrication and measurement techniques to remove external artifacts in photoelectronic responses. This reveals a previously hidden photothermoelectric response in the transverse photoresistivity of symmetric thin films of simple metals. We identify its origin in thermal gradients producing current deflection and determine the device design and measurement parameters to minimize extrinsic effects that arise in photoinduced electronic responses. |
| title | Transverse Photoresistivity from Photothermal Current Deflection in Metal Films |
| topic | Materials Science |
| url | https://arxiv.org/abs/2601.02340 |