Rubenzahl, R. A., Hattori, S., Särkkä, S., Farr, W. M., Luhn, J. K., Bedell, M., & Foreman-Mackey, D. (2026). Scalable Gaussian Processes for Integrated and Overlapping Measurements Via Augmented State Space Models.
Chicago Style (17th ed.) CitationRubenzahl, Ryan A., Soichiro Hattori, Simo Särkkä, Will M. Farr, Jacob K. Luhn, Megan Bedell, and Daniel Foreman-Mackey. Scalable Gaussian Processes for Integrated and Overlapping Measurements Via Augmented State Space Models. 2026.
MLA (9th ed.) CitationRubenzahl, Ryan A., et al. Scalable Gaussian Processes for Integrated and Overlapping Measurements Via Augmented State Space Models. 2026.
Warning: These citations may not always be 100% accurate.