Cita APA (7a ed.)

Rubenzahl, R. A., Hattori, S., Särkkä, S., Farr, W. M., Luhn, J. K., Bedell, M., & Foreman-Mackey, D. (2026). Scalable Gaussian Processes for Integrated and Overlapping Measurements Via Augmented State Space Models.

Cita Chicago Style (17a ed.)

Rubenzahl, Ryan A., Soichiro Hattori, Simo Särkkä, Will M. Farr, Jacob K. Luhn, Megan Bedell, y Daniel Foreman-Mackey. Scalable Gaussian Processes for Integrated and Overlapping Measurements Via Augmented State Space Models. 2026.

Cita MLA (9a ed.)

Rubenzahl, Ryan A., et al. Scalable Gaussian Processes for Integrated and Overlapping Measurements Via Augmented State Space Models. 2026.