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DeepBessel: deep learning-based full-field vibration profilometry using single-shot time-averaged interference microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cywinska, Maria, Forjasz, Wiktor, Wdowiak, Emilia, Jozwik, Michal, Styk, Adam, Patorski, Krzysztof, Trusiak, Maciej
Format:	Preprint
Published:	2026
Subjects:	Optics
Online Access:	Acceder al recurso
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