Electronic Structure of UGe$_{2\pm x}$ Thin Films from Photoelectron Spectroscopy

Fuente: arXiv
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Auteurs principaux: Alex, Sonu George, Romanyuk, Oleksandr, Zorilo, Ivan, Andreev, Alexander, Huber, Frank, Gouder, Thomas, Malinsky, Petr, Siddiqui, Maliha, Shick, Alexander B., Tereshina-Chitrova, Evgenia A.
Format: Preprint
Publié: 2026
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author Alex, Sonu George
Romanyuk, Oleksandr
Zorilo, Ivan
Andreev, Alexander
Huber, Frank
Gouder, Thomas
Malinsky, Petr
Siddiqui, Maliha
Shick, Alexander B.
Tereshina-Chitrova, Evgenia A.
author_facet Alex, Sonu George
Romanyuk, Oleksandr
Zorilo, Ivan
Andreev, Alexander
Huber, Frank
Gouder, Thomas
Malinsky, Petr
Siddiqui, Maliha
Shick, Alexander B.
Tereshina-Chitrova, Evgenia A.
contents Uranium digermanide UGe$_2$, the first ferromagnetic superconductor, represents a key composition in the U-Ge system dominated by U-5$f$ states. To examine the impact of controlled stoichiometric deviations on the electronic structure, UGe$_{2\pm x}$ thin films ($0 \le x \le 1$) were prepared by triode sputtering and studied on pristine surfaces by X-ray (XPS) and Ultraviolet (UPS) photoelectron spectroscopy. XPS and UPS reveal a robust metallic valence band with a dominant U-5$f$ contribution at the Fermi level and a broad incoherent feature at higher binding energies, without qualitative changes in spectral line shape across the composition range. The experimental spectrum of UGe$_2$ thin films is well reproduced by DFT+U(ED) valence-band calculations combining density functional theory with exact diagonalization of the multiconfigurational U-5$f$ shell. These results demonstrate that the overall U-Ge electronic framework of UGe$_2$ thin films remains resilient to moderate stoichiometric deviations, providing a reliable electronic baseline for future studies of interface- and heterostructure-driven phenomena in uranium-based systems.
format Preprint
id arxiv_https___arxiv_org_abs_2601_03902
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Electronic Structure of UGe$_{2\pm x}$ Thin Films from Photoelectron Spectroscopy
Alex, Sonu George
Romanyuk, Oleksandr
Zorilo, Ivan
Andreev, Alexander
Huber, Frank
Gouder, Thomas
Malinsky, Petr
Siddiqui, Maliha
Shick, Alexander B.
Tereshina-Chitrova, Evgenia A.
Strongly Correlated Electrons
Uranium digermanide UGe$_2$, the first ferromagnetic superconductor, represents a key composition in the U-Ge system dominated by U-5$f$ states. To examine the impact of controlled stoichiometric deviations on the electronic structure, UGe$_{2\pm x}$ thin films ($0 \le x \le 1$) were prepared by triode sputtering and studied on pristine surfaces by X-ray (XPS) and Ultraviolet (UPS) photoelectron spectroscopy. XPS and UPS reveal a robust metallic valence band with a dominant U-5$f$ contribution at the Fermi level and a broad incoherent feature at higher binding energies, without qualitative changes in spectral line shape across the composition range. The experimental spectrum of UGe$_2$ thin films is well reproduced by DFT+U(ED) valence-band calculations combining density functional theory with exact diagonalization of the multiconfigurational U-5$f$ shell. These results demonstrate that the overall U-Ge electronic framework of UGe$_2$ thin films remains resilient to moderate stoichiometric deviations, providing a reliable electronic baseline for future studies of interface- and heterostructure-driven phenomena in uranium-based systems.
title Electronic Structure of UGe$_{2\pm x}$ Thin Films from Photoelectron Spectroscopy
topic Strongly Correlated Electrons
url https://arxiv.org/abs/2601.03902