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A current source with metrological precision made on a 300mm silicon MOS process

Fuente: arXiv

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Bibliographic Details
Main Authors:	Johnson, Nathan, Kubicek, Stefan, Jussot, Julien, Canvel, Yann, De Greve, Kristiaan, Gonzalez-Zalba, M. Fernando, Leon, Ross C. C., Morton, John J. L.
Format:	Preprint
Published:	2026
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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