Widefield two-photon random illumination microscopy (2P-RIM)

Fuente: arXiv
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Main Authors: Benachir, Assia, Li, Xiangyi, Fantuzzi, Eric M., Giroussens, Guillaume, Mangeat, Thomas, Vernuccio, Federico, Rigneault, Hervé, Sentenac, Anne, Heuke, Sandro
Format: Preprint
Published: 2026
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author Benachir, Assia
Li, Xiangyi
Fantuzzi, Eric M.
Giroussens, Guillaume
Mangeat, Thomas
Vernuccio, Federico
Rigneault, Hervé
Sentenac, Anne
Heuke, Sandro
author_facet Benachir, Assia
Li, Xiangyi
Fantuzzi, Eric M.
Giroussens, Guillaume
Mangeat, Thomas
Vernuccio, Federico
Rigneault, Hervé
Sentenac, Anne
Heuke, Sandro
contents Biological and biomedical samples are routinely examined using focused two-photon (2P) fluorescence microscopy due to its intrinsic axial sectioning and reduced out-of-focus bleaching. However, 2P imaging often requires excitation intensities that can damage samples through ionization and radical formation. Additionally, the lateral resolution of 2P microscopy is lower compared to linear one-photon (1P) fluorescence microscopy. Widefield 2P microscopy, using cameras, holds promise for reducing photo-toxicity while maintaining high image acquisition rates. Widefield imaging trades the high power and short integration times of sequential single point scanning for the low power and extended integration times of parallel detection across millions of pixels. However, generating effective axial sectioning over arbitrarily large fields of view (FOVs) has remained a challenge. In this work, we introduce 2P Random Illumination Microscopy (2P-RIM), an easy-to-implement 2P widefield technique, that achieves low photo-damage, fast imaging, micrometric axial sectioning, and enhanced lateral resolution for arbitrarily large FOVs. By using widefield speckled illuminations in conjunction with an image standard deviation matching algorithm, 2P-RIM demonstrated multicolor imaging over FOVs greater than 200 um, lateral resolution 220 nm, axial sectioning 2 um, and peak excitation powers about 10 times lower than those used in focused laser scanning microscopy.
format Preprint
id arxiv_https___arxiv_org_abs_2601_04928
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Widefield two-photon random illumination microscopy (2P-RIM)
Benachir, Assia
Li, Xiangyi
Fantuzzi, Eric M.
Giroussens, Guillaume
Mangeat, Thomas
Vernuccio, Federico
Rigneault, Hervé
Sentenac, Anne
Heuke, Sandro
Optics
Biological and biomedical samples are routinely examined using focused two-photon (2P) fluorescence microscopy due to its intrinsic axial sectioning and reduced out-of-focus bleaching. However, 2P imaging often requires excitation intensities that can damage samples through ionization and radical formation. Additionally, the lateral resolution of 2P microscopy is lower compared to linear one-photon (1P) fluorescence microscopy. Widefield 2P microscopy, using cameras, holds promise for reducing photo-toxicity while maintaining high image acquisition rates. Widefield imaging trades the high power and short integration times of sequential single point scanning for the low power and extended integration times of parallel detection across millions of pixels. However, generating effective axial sectioning over arbitrarily large fields of view (FOVs) has remained a challenge. In this work, we introduce 2P Random Illumination Microscopy (2P-RIM), an easy-to-implement 2P widefield technique, that achieves low photo-damage, fast imaging, micrometric axial sectioning, and enhanced lateral resolution for arbitrarily large FOVs. By using widefield speckled illuminations in conjunction with an image standard deviation matching algorithm, 2P-RIM demonstrated multicolor imaging over FOVs greater than 200 um, lateral resolution 220 nm, axial sectioning 2 um, and peak excitation powers about 10 times lower than those used in focused laser scanning microscopy.
title Widefield two-photon random illumination microscopy (2P-RIM)
topic Optics
url https://arxiv.org/abs/2601.04928