Saved in:
Bibliographic Details
Main Authors: Prananto, Dwi, Wang, Yifei, Kainuma, Yuta, Hayashi, Kunitaka, Tomitori, Masahiko, An, Toshu
Format: Preprint
Published: 2026
Subjects:
Online Access:https://arxiv.org/abs/2601.07188
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866917195851759616
author Prananto, Dwi
Wang, Yifei
Kainuma, Yuta
Hayashi, Kunitaka
Tomitori, Masahiko
An, Toshu
author_facet Prananto, Dwi
Wang, Yifei
Kainuma, Yuta
Hayashi, Kunitaka
Tomitori, Masahiko
An, Toshu
contents Scanning diamond nitrogen-vacancy probe microscopy (SNVM) is an important tool for studying nanoscale condensed-matter phenomena. Ga$^+$-ion-focused-ion-beam (FIB) milling has been introduced as an available method for fabricating SNVM, while the probe diameter is limited to a few micrometers due to the Ga$^+$-induced damage. We report a method for improving the SNVM probes' quality, with an 800-nm diameter probe of ultrapure diamond, through polyvinyl alcohol and Pt/Pd capping, followed by UV/ozone exposure. The effectiveness of the method is confirmed by NVs' spin-coherence property measurements and magnetic domain structure imaging with a few-hundred-nanometer resolution and a 6.7 $μ$T/Hz$^{1/2}$ sensitivity.
format Preprint
id arxiv_https___arxiv_org_abs_2601_07188
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Improvement of a focused ion beam fabricated diamond pillar for scanning ensemble nitrogen-vacancy magnetometry probe using an ultrapure diamond
Prananto, Dwi
Wang, Yifei
Kainuma, Yuta
Hayashi, Kunitaka
Tomitori, Masahiko
An, Toshu
Materials Science
Scanning diamond nitrogen-vacancy probe microscopy (SNVM) is an important tool for studying nanoscale condensed-matter phenomena. Ga$^+$-ion-focused-ion-beam (FIB) milling has been introduced as an available method for fabricating SNVM, while the probe diameter is limited to a few micrometers due to the Ga$^+$-induced damage. We report a method for improving the SNVM probes' quality, with an 800-nm diameter probe of ultrapure diamond, through polyvinyl alcohol and Pt/Pd capping, followed by UV/ozone exposure. The effectiveness of the method is confirmed by NVs' spin-coherence property measurements and magnetic domain structure imaging with a few-hundred-nanometer resolution and a 6.7 $μ$T/Hz$^{1/2}$ sensitivity.
title Improvement of a focused ion beam fabricated diamond pillar for scanning ensemble nitrogen-vacancy magnetometry probe using an ultrapure diamond
topic Materials Science
url https://arxiv.org/abs/2601.07188