Salvato in:
| Autori principali: | , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2026
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| Soggetti: | |
| Accesso online: | https://arxiv.org/abs/2601.07188 |
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Sommario:
- Scanning diamond nitrogen-vacancy probe microscopy (SNVM) is an important tool for studying nanoscale condensed-matter phenomena. Ga$^+$-ion-focused-ion-beam (FIB) milling has been introduced as an available method for fabricating SNVM, while the probe diameter is limited to a few micrometers due to the Ga$^+$-induced damage. We report a method for improving the SNVM probes' quality, with an 800-nm diameter probe of ultrapure diamond, through polyvinyl alcohol and Pt/Pd capping, followed by UV/ozone exposure. The effectiveness of the method is confirmed by NVs' spin-coherence property measurements and magnetic domain structure imaging with a few-hundred-nanometer resolution and a 6.7 $μ$T/Hz$^{1/2}$ sensitivity.