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Bibliographic Details
Main Authors: Bednarczuk, Ewa, Bieńkowski, Rafał, Kłopotek, Robert, Kryński, Jan, Leśsniewski, Krzysztof, Rutkowski, Krzysztof, Szelachowska, Małgorzata
Format: Preprint
Published: 2026
Subjects:
Online Access:https://arxiv.org/abs/2601.07621
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Table of Contents:
  • We address the problem of comparing and aligning spatial point configurations in $\mathbb{R}^3$ arising from structured geometric patterns. Each pattern is decomposed into arms along which we define a normalized finite-difference operator measuring local variations of the height component with respect to the planar geometry of the pattern. This quantity provides a parametrization-independent local descriptor that complements global similarity measures. In particular, it integrates naturally with Wasserstein-type distances for comparing point distributions and with Procrustes analysis for rigid alignment of geometric structures.