Noise2Void for Denoising Atomic Resolution Scanning Transmission Electron Microscopy Images

Fuente: arXiv

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Bibliographic Details
Main Authors:	Thornley, William, Sullivan-Allsop, Sam, Cai, Rongsheng, Clark, Nick, Gorbachev, Roman, Haigh, Sarah J.
Format:	Preprint
Published:	2026
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2601.07699