Cover Image

Noise2Void for Denoising Atomic Resolution Scanning Transmission Electron Microscopy Images

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Thornley, William, Sullivan-Allsop, Sam, Cai, Rongsheng, Clark, Nick, Gorbachev, Roman, Haigh, Sarah J.
Format:	Preprint
Published:	2026
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Similar Items

Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy
by: Pattison, Alexander, et al.
Published: (2023)

Scanning Transmission Electron Microscopy of Oxide Interfaces and Heterostructures
by: Spurgeon, Steven R.
Published: (2020)

Measurement of the Resolution of the Timepix4 Detector for 100 keV and 200 keV Electrons for Transmission Electron Microscopy
by: Dimova, N., et al.
Published: (2024)

BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization
by: Pattison, Alexander J., et al.
Published: (2024)

Open Gas-Cell Transmission Electron Microscopy at 50 pm Resolution
by: Biran, Idan, et al.
Published: (2025)

A Transformer-based Model for Rapid Microstructure Inference from Four-Dimensional Scanning Transmission Electron Microscopy Data
by: Je, Kwanghwi, et al.
Published: (2026)

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
by: Hoffmann, Johannes, et al.
Published: (2024)

Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy
by: Wirtensohn, Sami, et al.
Published: (2024)

Scanning Tunneling Microscopy in high vectorial magnetic fields
by: Ozores, Jaime Rumeu, et al.
Published: (2026)

A Laser Phase Plate for Transmission Electron Microscopy
by: Axelrod, Jeremy J.
Published: (2024)

afspm: A Framework for Manufacturer-Agnostic Automation in Scanning Probe Microscopy
by: Sullivan, Nicholas J., et al.
Published: (2025)

High Dynamic Range Scanning Tunneling Microscopy
by: Karić, Ajla, et al.
Published: (2024)

Full-Field Brillouin Microscopy with a Scanning Fabry-Perot Interferometer
by: Pochylski, Mikolaj
Published: (2025)

High-throughput Parasitic-independent Probe Thermal Resistance Calibration for Robust Thermal Mapping with Scanning Thermal Microscopy
by: Munde, Ram, et al.
Published: (2025)

Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy
by: Pratiush, Utkarsh, et al.
Published: (2025)

Nanoscale Three-Dimensional Imaging of Integrated Circuits using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer
by: Nakamura, Nathan, et al.
Published: (2022)

Directional Dark Field for Nanoscale Full-Field Transmission X-Ray Microscopy
by: Wirtensohn, Sami, et al.
Published: (2025)

Scanning Acoustic Microscopy for Quantifying Bubble Evolution in Alkaline Water Electrolyzers
by: Dou, Zehua, et al.
Published: (2024)

Detection of MEMS Acoustics via Scanning Tunneling Microscopy
by: Elbertse, R. J. G., et al.
Published: (2026)

X-ray Microscopy and Talbot Imaging with the Matter in Extreme Conditions X-ray Imager at LCLS
by: Galtier, Eric, et al.
Published: (2024)

Advancing Time-Resolved Spectroscopies with Custom Scanning Units and Event-Based Electron Detection
by: Auad, Yves, et al.
Published: (2025)

Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope
by: Simonaitis, John W., et al.
Published: (2024)

Practical Crystallography with a Transmission Electron Microscope
by: Weare, Benjamin L., et al.
Published: (2025)

Coplanar waveguide ground potentials imbalance as a source of useful signal in Near-Field Scanning Microwave Microscopy
by: Gladilovich, P. A., et al.
Published: (2024)

Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping
by: Sendra, Joan, et al.
Published: (2023)

Quantifying Resolution in Pink Beam Dark Field X-ray Microscopy: Experiments and Simulations
by: La Bella, Michela, et al.
Published: (2025)

A Helical-Deflector-Based Radio-Frequency Spiral Scanning System for keV Energy Electrons
by: Zhamkochyan, Simon, et al.
Published: (2026)

Low-Resolution Imaging FMCW Lidar
by: Gazizov, Iskander, et al.
Published: (2022)

Towards Low-Energy Electron High-Resolution Spectroscopy with Transition-Edge Sensors
by: Ammendola, R., et al.
Published: (2026)

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
by: Zhang, Tianbi, et al.
Published: (2024)

Implementing dynamic high-performance computing supported workflows on Scanning Transmission Electron Microscope
by: Pratiush, Utkarsh, et al.
Published: (2024)

Source Shot Noise Mitigation in Focused Ion Beam Microscopy by Time-Resolved Measurement
by: Peng, Minxu, et al.
Published: (2019)

Standardizing Force Reconstruction in Dynamic Atomic Force Microscopy
by: Laflamme, Simon, et al.
Published: (2025)

Prospects for Direct Electron Detectors in Ultrafast Electron Diffraction and Scattering Experiments
by: Kremeyer, Laurenz, et al.
Published: (2026)

Characterization of the Electronic Noise in the Readout of Resistive Micromegas in the High-Angle Time Projection Chambers of the T2K Experiment
by: Attié, D., et al.
Published: (2025)

Skipper-in-CMOS: Non-Destructive Readout with Sub-Electron Noise Performance for Pixel Detectors
by: Lapi, Agustin J., et al.
Published: (2024)

Ultralow-Temperature Cryogenic Transmission Electron Microscopy Using a New Helium Flow Cryostat Stage
by: Kim, Young-Hoon, et al.
Published: (2025)

Scanning Thermal Microscopy in Air and Vacuum: A Comparison
by: McClelland, Jabez J., et al.
Published: (2024)

Fourier Transform-Based Post-Processing Drift Compensation and Calibration Method for Scanning Probe Microscopy
by: Ster, Maxime Le, et al.
Published: (2023)

GRANITE: High-Resolution Imaging and Electrical Qualification of Large-Area TPC Electrodes
by: Mitra, Shumit A., et al.
Published: (2025)