Modeling Event Dynamics by Self-Exciting Processes with Random Memory

Fuente: arXiv

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Bibliographic Details
Main Authors:	Peng, K. Ken, Hu, X. Joan, Swartz, Tim B.
Format:	Preprint
Published:	2026
Subjects:	Methodology Applications
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2601.07980