Reliability Modeling of Single-Sided Aluminized Polyimide Films during Storage Considering Stress-Induced Degradation Mechanism Transition

Fuente: arXiv

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Bibliographic Details
Main Authors:	Chen, Shi-Shun, Niu, Dong-Hua, Chen, Wen-Bin, Song, Jia-Yun, Zhang, Ya-Fei, Li, Xiao-Yang, Zio, Enrico
Format:	Preprint
Published:	2026
Subjects:	Applications
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2601.08655