Buchumschlag

Reliability Modeling of Single-Sided Aluminized Polyimide Films during Storage Considering Stress-Induced Degradation Mechanism Transition

Fuente: arXiv

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Bibliographische Detailangaben
Hauptverfasser:	Chen, Shi-Shun, Niu, Dong-Hua, Chen, Wen-Bin, Song, Jia-Yun, Zhang, Ya-Fei, Li, Xiao-Yang, Zio, Enrico
Format:	Preprint
Veröffentlicht:	2026
Schlagworte:	Applications
Online-Zugang:	Acceder al recurso
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

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