Comprehensive Machine Learning Benchmarking for Fringe Projection Profilometry with Photorealistic Synthetic Data

Fuente: arXiv

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Bibliographic Details
Main Authors:	S, Anush Lakshman, Haroon, Adam, Li, Beiwen
Format:	Preprint
Published:	2026
Subjects:	Image and Video Processing Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2601.08900