Toward Understanding Unlearning Difficulty: A Mechanistic Perspective and Circuit-Guided Difficulty Metric

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cheng, Jiali, Chen, Ziheng, Agarwal, Chirag, Amiri, Hadi
Format:	Preprint
Published:	2026
Subjects:	Machine Learning Artificial Intelligence Computation and Language Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2601.09624