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Radiation tolerance tests on key components of the ePIC-dRICH readout card

Fuente: arXiv
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Main Authors: Geminiani, S., Achari, B. R., Agrawal, N., Alexeev, M., Alice, C., Ammendola, R., Antonioli, P., Baldanza, C., Barion, L., Biagioni, A., Calivà, A., Capua, M., Capuani, F., Ciardiello, A., Cisbani, E., Chiosso, M., Contalbrigo, M., Cossio, F., Rolo, M. Da Rocha, De Caro, A., De Gruttola, D., Dellacasa, G., Falchieri, D., Fazio, S., Frezza, O., Funicello, N., Garbini, M., Jacazio, N., Cicero, F. Lo, Lonardo, A., Malaguti, R., Mammoliti, F., Martinelli, M., Mignone, M., Mingioni, C., Nenni, M., Noto, F., Occhiuto, L., Paladino, A., Panzieri, D., Perticaroli, P., Plavully, S., Polizzi, L., Pontisso, L., Preghenella, R., Ricci, R., Rignanese, L., Ripoli, C., Rossi, C., Rovati, E., Rubini, N., Ruspa, M., Saputi, A., Simula, F., Spizzo, F., Tamponi, U., Tassi, E., Torromeo, G., Tuvè, C., Urciuoli, G. M., Vallarino, S., Vicini, P., Wheadon, R.
Format: Preprint
Published: 2026
Subjects:
Instrumentation and Detectors
Online Access:
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author Geminiani, S.
Achari, B. R.
Agrawal, N.
Alexeev, M.
Alice, C.
Ammendola, R.
Antonioli, P.
Baldanza, C.
Barion, L.
Biagioni, A.
Calivà, A.
Capua, M.
Capuani, F.
Ciardiello, A.
Cisbani, E.
Chiosso, M.
Contalbrigo, M.
Cossio, F.
Rolo, M. Da Rocha
De Caro, A.
De Gruttola, D.
Dellacasa, G.
Falchieri, D.
Fazio, S.
Frezza, O.
Funicello, N.
Garbini, M.
Jacazio, N.
Cicero, F. Lo
Lonardo, A.
Malaguti, R.
Mammoliti, F.
Martinelli, M.
Mignone, M.
Mingioni, C.
Nenni, M.
Noto, F.
Occhiuto, L.
Paladino, A.
Panzieri, D.
Perticaroli, P.
Plavully, S.
Polizzi, L.
Pontisso, L.
Preghenella, R.
Ricci, R.
Rignanese, L.
Ripoli, C.
Rossi, C.
Rovati, E.
Rubini, N.
Ruspa, M.
Saputi, A.
Simula, F.
Spizzo, F.
Tamponi, U.
Tassi, E.
Torromeo, G.
Tuvè, C.
Urciuoli, G. M.
Vallarino, S.
Vicini, P.
Wheadon, R.
author_facet Geminiani, S.
Achari, B. R.
Agrawal, N.
Alexeev, M.
Alice, C.
Ammendola, R.
Antonioli, P.
Baldanza, C.
Barion, L.
Biagioni, A.
Calivà, A.
Capua, M.
Capuani, F.
Ciardiello, A.
Cisbani, E.
Chiosso, M.
Contalbrigo, M.
Cossio, F.
Rolo, M. Da Rocha
De Caro, A.
De Gruttola, D.
Dellacasa, G.
Falchieri, D.
Fazio, S.
Frezza, O.
Funicello, N.
Garbini, M.
Jacazio, N.
Cicero, F. Lo
Lonardo, A.
Malaguti, R.
Mammoliti, F.
Martinelli, M.
Mignone, M.
Mingioni, C.
Nenni, M.
Noto, F.
Occhiuto, L.
Paladino, A.
Panzieri, D.
Perticaroli, P.
Plavully, S.
Polizzi, L.
Pontisso, L.
Preghenella, R.
Ricci, R.
Rignanese, L.
Ripoli, C.
Rossi, C.
Rovati, E.
Rubini, N.
Ruspa, M.
Saputi, A.
Simula, F.
Spizzo, F.
Tamponi, U.
Tassi, E.
Torromeo, G.
Tuvè, C.
Urciuoli, G. M.
Vallarino, S.
Vicini, P.
Wheadon, R.
contents The dual-radiator RICH (dRICH) detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5x5x12 cm^3 in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny817 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.
format Preprint
id arxiv_https___arxiv_org_abs_2601_09675
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Radiation tolerance tests on key components of the ePIC-dRICH readout card
Geminiani, S.
Achari, B. R.
Agrawal, N.
Alexeev, M.
Alice, C.
Ammendola, R.
Antonioli, P.
Baldanza, C.
Barion, L.
Biagioni, A.
Calivà, A.
Capua, M.
Capuani, F.
Ciardiello, A.
Cisbani, E.
Chiosso, M.
Contalbrigo, M.
Cossio, F.
Rolo, M. Da Rocha
De Caro, A.
De Gruttola, D.
Dellacasa, G.
Falchieri, D.
Fazio, S.
Frezza, O.
Funicello, N.
Garbini, M.
Jacazio, N.
Cicero, F. Lo
Lonardo, A.
Malaguti, R.
Mammoliti, F.
Martinelli, M.
Mignone, M.
Mingioni, C.
Nenni, M.
Noto, F.
Occhiuto, L.
Paladino, A.
Panzieri, D.
Perticaroli, P.
Plavully, S.
Polizzi, L.
Pontisso, L.
Preghenella, R.
Ricci, R.
Rignanese, L.
Ripoli, C.
Rossi, C.
Rovati, E.
Rubini, N.
Ruspa, M.
Saputi, A.
Simula, F.
Spizzo, F.
Tamponi, U.
Tassi, E.
Torromeo, G.
Tuvè, C.
Urciuoli, G. M.
Vallarino, S.
Vicini, P.
Wheadon, R.
Instrumentation and Detectors
The dual-radiator RICH (dRICH) detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5x5x12 cm^3 in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny817 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.
title Radiation tolerance tests on key components of the ePIC-dRICH readout card
topic Instrumentation and Detectors
url https://arxiv.org/abs/2601.09675

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