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| Main Authors: | , , , , , , , , , , , |
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| Format: | Preprint |
| Published: |
2026
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2601.11086 |
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| _version_ | 1866914258553405440 |
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| author | Liu, Chenlu Li, Yulong Wang, Jiahui Guan, Quan Jin, Lijing Ma, Lu Hu, Ruizi Wang, Tenghui Zhu, Xing Yu, Hai-Feng Deng, Chunqing Ma, Xizheng |
| author_facet | Liu, Chenlu Li, Yulong Wang, Jiahui Guan, Quan Jin, Lijing Ma, Lu Hu, Ruizi Wang, Tenghui Zhu, Xing Yu, Hai-Feng Deng, Chunqing Ma, Xizheng |
| contents | Qubits that experience predominantly erasure errors offer distinct advantages for fault-tolerant operation. Indeed, dual-rail encoded erasure qubits in superconducting cavities and transmons have demonstrated high-fidelity operations by converting physical-qubit relaxation into logical-qubit erasures, but this comes at the cost of increased hardware overhead and circuit complexity. Here, we address these limitations by realizing erasure conversion in a single fluxonium operated at zero flux, where the logical state is encoded in its 0-2 subspace. A single, carefully engineered resonator provides both mid-circuit erasure detection and end-of-line (EOL) logical measurement. Post-selection on non-erasure outcomes results in more than four-fold increase of the logical lifetime, from $193~μ$s to $869~μ$s. Finally, we characterize measurement-induced logical dephasing as a function of measurement power and frequency, and infer that each erasure check contributes a negligible error of $7.2\times 10^{-5}$. These results establish integer-fluxonium as a promising, resource-efficient platform for erasure-based error mitigation, without requiring additional hardware. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2601_11086 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Converting qubit relaxation into erasures with a single fluxonium Liu, Chenlu Li, Yulong Wang, Jiahui Guan, Quan Jin, Lijing Ma, Lu Hu, Ruizi Wang, Tenghui Zhu, Xing Yu, Hai-Feng Deng, Chunqing Ma, Xizheng Quantum Physics Qubits that experience predominantly erasure errors offer distinct advantages for fault-tolerant operation. Indeed, dual-rail encoded erasure qubits in superconducting cavities and transmons have demonstrated high-fidelity operations by converting physical-qubit relaxation into logical-qubit erasures, but this comes at the cost of increased hardware overhead and circuit complexity. Here, we address these limitations by realizing erasure conversion in a single fluxonium operated at zero flux, where the logical state is encoded in its 0-2 subspace. A single, carefully engineered resonator provides both mid-circuit erasure detection and end-of-line (EOL) logical measurement. Post-selection on non-erasure outcomes results in more than four-fold increase of the logical lifetime, from $193~μ$s to $869~μ$s. Finally, we characterize measurement-induced logical dephasing as a function of measurement power and frequency, and infer that each erasure check contributes a negligible error of $7.2\times 10^{-5}$. These results establish integer-fluxonium as a promising, resource-efficient platform for erasure-based error mitigation, without requiring additional hardware. |
| title | Converting qubit relaxation into erasures with a single fluxonium |
| topic | Quantum Physics |
| url | https://arxiv.org/abs/2601.11086 |