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Towards reliable electrical measurements of superconducting devices inside a transmission electron microscope

Fuente: arXiv

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Bibliographic Details
Main Authors:	Thomsen, Joachim Dahl, Faley, Michael I., Vas, Joseph Vimal, Clausen, Alexander, Denneulin, Thibaud, Biscette, Dominik, Sutter, Denys, Lu, Peng-Han, Dunin-Borkowski, Rafal E.
Format:	Preprint
Published:	2026
Subjects:	Superconductivity
Online Access:	Acceder al recurso
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