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Main Authors: Kakda, Mohit, Muthukumaran, Mirudula Shri, Patel, Uttapreksha, Prince, Lawrence Swaminathan Xavier
Format: Preprint
Published: 2026
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Online Access:https://arxiv.org/abs/2601.13440
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_version_ 1866911386904297472
author Kakda, Mohit
Muthukumaran, Mirudula Shri
Patel, Uttapreksha
Prince, Lawrence Swaminathan Xavier
author_facet Kakda, Mohit
Muthukumaran, Mirudula Shri
Patel, Uttapreksha
Prince, Lawrence Swaminathan Xavier
contents Vision-Language Models (VLMs), particularly CLIP, have revolutionized anomaly detection by enabling zero-shot and few-shot defect identification without extensive labeled datasets. By learning aligned representations of images and text, VLMs facilitate anomaly classification and segmentation through natural language descriptions of normal and abnormal states, eliminating traditional requirements for task-specific training or defect examples. This project presents a comprehensive analysis of VLM-based approaches for anomaly classification (AC) and anomaly segmentation (AS). We systematically investigate key architectural paradigms including sliding window-based dense feature extraction (WinCLIP), multi-stage feature alignment with learnable projections (AprilLab framework), and compositional prompt ensemble strategies. Our analysis evaluates these methods across critical dimensions: feature extraction mechanisms, text-visual alignment strategies, prompt engineering techniques, zero-shot versus few-shot trade-offs, computational efficiency, and cross-domain generalization. Through rigorous experimentation on benchmarks such as MVTec AD and VisA, we compare classification accuracy, segmentation precision, and inference efficiency. The primary contribution is a foundational understanding of how and why VLMs succeed in anomaly detection, synthesizing practical insights for method selection and identifying current limitations. This work aims to facilitate informed adoption of VLM-based methods in industrial quality control and guide future research directions.
format Preprint
id arxiv_https___arxiv_org_abs_2601_13440
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Analyzing VLM-Based Approaches for Anomaly Classification and Segmentation
Kakda, Mohit
Muthukumaran, Mirudula Shri
Patel, Uttapreksha
Prince, Lawrence Swaminathan Xavier
Computer Vision and Pattern Recognition
Vision-Language Models (VLMs), particularly CLIP, have revolutionized anomaly detection by enabling zero-shot and few-shot defect identification without extensive labeled datasets. By learning aligned representations of images and text, VLMs facilitate anomaly classification and segmentation through natural language descriptions of normal and abnormal states, eliminating traditional requirements for task-specific training or defect examples. This project presents a comprehensive analysis of VLM-based approaches for anomaly classification (AC) and anomaly segmentation (AS). We systematically investigate key architectural paradigms including sliding window-based dense feature extraction (WinCLIP), multi-stage feature alignment with learnable projections (AprilLab framework), and compositional prompt ensemble strategies. Our analysis evaluates these methods across critical dimensions: feature extraction mechanisms, text-visual alignment strategies, prompt engineering techniques, zero-shot versus few-shot trade-offs, computational efficiency, and cross-domain generalization. Through rigorous experimentation on benchmarks such as MVTec AD and VisA, we compare classification accuracy, segmentation precision, and inference efficiency. The primary contribution is a foundational understanding of how and why VLMs succeed in anomaly detection, synthesizing practical insights for method selection and identifying current limitations. This work aims to facilitate informed adoption of VLM-based methods in industrial quality control and guide future research directions.
title Analyzing VLM-Based Approaches for Anomaly Classification and Segmentation
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2601.13440