Bowden, L., Chu, Q., Cena, B., Ohno, K., Parney, B., Sharma, D., & Takeori, M. (2026). Machine Failure Detection Based on Projected Quantum Models.
Chicago Style (17th ed.) CitationBowden, Larry, Qi Chu, Bernard Cena, Kentaro Ohno, Bob Parney, Deepak Sharma, and Mitsuharu Takeori. Machine Failure Detection Based on Projected Quantum Models. 2026.
MLA (9th ed.) CitationBowden, Larry, et al. Machine Failure Detection Based on Projected Quantum Models. 2026.
Warning: These citations may not always be 100% accurate.