Physical and Dielectric Properties of Polycrystalline LaV$_{0.5}$Nb$_{0.5}$O$_4$
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arXiv
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| Autori principali: | , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2026
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| _version_ | 1866917218042773504 |
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| author | Kumar, Ashok Sapra, Simranjot K. Meena, Ramcharan Singh, Vinod Dhaka, Anita Dhaka, Rajendra S. |
| author_facet | Kumar, Ashok Sapra, Simranjot K. Meena, Ramcharan Singh, Vinod Dhaka, Anita Dhaka, Rajendra S. |
| contents | We report a detailed investigation of the structural, electronic, vibrational, and dielectric properties of polycrystalline LaV$_{0.5}$Nb$_{0.5}$O$_4$ samples, prepared at two sintering temperatures (1000\degree C and 1250\degree C). The introduction of Nb$^{5+}$ at the V$^{5+}$ site leads to notable structural and vibrational changes, which can be attributed to their isoelectronic nature and the comparatively larger ionic radius of Nb$^{5+}$. The Rietveld refinement of the X-ray diffraction patterns confirms a coexistence of monoclinic ($P$2$_{1}$/$n$) and scheelite-type tetragonal ($I$4$_{1}$/$a$) phases; for example, with a fraction of 4\% and 96\% for the sample annealed at 1250\degree C. The particle morphology has altered from spherical (1000\degree C) to irregular-shaped (1250\degree C) as a result of increase in annealing temperature. The Raman spectroscopy, Fourier Transform Infrared spectroscopy and X-ray Photoemission Spectroscopy have been used to understand the vibrational and electronic properties. An optical band gap of 2.7~eV for the sample sintered at 1250\degree C is calculated using Ultraviolet-vis diffuse reflectance spectroscopy measurements. The dielectric studies shows the higher dielectric permittivity ($ε$$_{r}$) and lower dielectric loss for the sample annealed at 1250\degree C. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2601_16067 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Physical and Dielectric Properties of Polycrystalline LaV$_{0.5}$Nb$_{0.5}$O$_4$ Kumar, Ashok Sapra, Simranjot K. Meena, Ramcharan Singh, Vinod Dhaka, Anita Dhaka, Rajendra S. Materials Science Strongly Correlated Electrons We report a detailed investigation of the structural, electronic, vibrational, and dielectric properties of polycrystalline LaV$_{0.5}$Nb$_{0.5}$O$_4$ samples, prepared at two sintering temperatures (1000\degree C and 1250\degree C). The introduction of Nb$^{5+}$ at the V$^{5+}$ site leads to notable structural and vibrational changes, which can be attributed to their isoelectronic nature and the comparatively larger ionic radius of Nb$^{5+}$. The Rietveld refinement of the X-ray diffraction patterns confirms a coexistence of monoclinic ($P$2$_{1}$/$n$) and scheelite-type tetragonal ($I$4$_{1}$/$a$) phases; for example, with a fraction of 4\% and 96\% for the sample annealed at 1250\degree C. The particle morphology has altered from spherical (1000\degree C) to irregular-shaped (1250\degree C) as a result of increase in annealing temperature. The Raman spectroscopy, Fourier Transform Infrared spectroscopy and X-ray Photoemission Spectroscopy have been used to understand the vibrational and electronic properties. An optical band gap of 2.7~eV for the sample sintered at 1250\degree C is calculated using Ultraviolet-vis diffuse reflectance spectroscopy measurements. The dielectric studies shows the higher dielectric permittivity ($ε$$_{r}$) and lower dielectric loss for the sample annealed at 1250\degree C. |
| title | Physical and Dielectric Properties of Polycrystalline LaV$_{0.5}$Nb$_{0.5}$O$_4$ |
| topic | Materials Science Strongly Correlated Electrons |
| url | https://arxiv.org/abs/2601.16067 |