Mobile charges in MoS2/high-k oxide transistors: from abnormal instabilities to memory-like dynamics

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhou, Shaokai, Cai, Haihui, Wu, Yehao, Min, Yufeng, Yuan, Renchen, Lv, Yezhu, Huang, Jianming, Shi, Yuanyuan, Illarionov, Yury Yuryevich
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2601.16526