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Atomic Depth Estimation From Noisy Electron Microscopy Data Via Deep Learning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Leibovich, Matan, Tan, Mai, Manzorro, Ramon, Marcos-Morales, Adria, Mohan, Sreyas, Crozier, Peter A., Fernandez-Granda, Carlos
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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