SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis

Fuente: arXiv

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Bibliographic Details
Main Authors:	Tan, Jing Jie, Schreiner, Rupert, Hausladen, Matthias, Asgharzade, Ali, Edler, Simon, Bartsch, Julian, Bachmann, Michael, Schels, Andreas, Kwan, Ban-Hoe, Ng, Danny Wee-Kiat, Hum, Yan-Chai
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2601.17048