Data-driven Test Generation for Fuzzing AI Compiler

Fuente: arXiv
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Main Author: Shen, Qingchao
Format: Preprint
Published: 2026
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author Shen, Qingchao
author_facet Shen, Qingchao
contents Artificial Intelligence (AI) compilers are critical for efficiently deploying AI models across diverse hardware platforms. However, they remain prone to bugs that can compromise both compiler reliability and model correctness. Thus, ensuring the quality of AI compilers is crucial. In this work, we present a unified data-driven testing framework that systematically addresses stage-specific challenges in AI compilers. Specifically, OPERA migrates tests for AI libraries to test various operator conversion logic in the model loading stage. OATest synthesizes diverse optimization-aware computational graphs for testing high-level optimizations. HARMONY generates and mutates diverse low-level IR seeds to generate hardware-optimization-aware tests for testing low-level optimizations. Together, these techniques provide a comprehensive, stage-aware framework that enhances testing coverage and effectiveness, detecting 266 previously unknown bugs in four widely used AI compilers.
format Preprint
id arxiv_https___arxiv_org_abs_2601_17450
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Data-driven Test Generation for Fuzzing AI Compiler
Shen, Qingchao
Software Engineering
Artificial Intelligence (AI) compilers are critical for efficiently deploying AI models across diverse hardware platforms. However, they remain prone to bugs that can compromise both compiler reliability and model correctness. Thus, ensuring the quality of AI compilers is crucial. In this work, we present a unified data-driven testing framework that systematically addresses stage-specific challenges in AI compilers. Specifically, OPERA migrates tests for AI libraries to test various operator conversion logic in the model loading stage. OATest synthesizes diverse optimization-aware computational graphs for testing high-level optimizations. HARMONY generates and mutates diverse low-level IR seeds to generate hardware-optimization-aware tests for testing low-level optimizations. Together, these techniques provide a comprehensive, stage-aware framework that enhances testing coverage and effectiveness, detecting 266 previously unknown bugs in four widely used AI compilers.
title Data-driven Test Generation for Fuzzing AI Compiler
topic Software Engineering
url https://arxiv.org/abs/2601.17450