APA (7th ed.) Citation

Hessong, E. C., della Ventura, N. M., Niu, T., Gianola, D. S., Kim, H., Li, N., . . . Rupert, T. J. (2026). Thicker amorphous grain boundary complexions reduce plastic strain localization in nanocrystalline Cu-Zr.

Chicago Style (17th ed.) Citation

Hessong, Esther C., Nicolo Maria della Ventura, Tongjun Niu, Daniel S. Gianola, Hyosim Kim, Nan Li, Saryu Fensin, Brad L. Boyce, and Timothy J. Rupert. Thicker Amorphous Grain Boundary Complexions Reduce Plastic Strain Localization in Nanocrystalline Cu-Zr. 2026.

MLA (9th ed.) Citation

Hessong, Esther C., et al. Thicker Amorphous Grain Boundary Complexions Reduce Plastic Strain Localization in Nanocrystalline Cu-Zr. 2026.