Thicker amorphous grain boundary complexions reduce plastic strain localization in nanocrystalline Cu-Zr

Fuente: arXiv
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Autores principales: Hessong, Esther C., della Ventura, Nicolo Maria, Niu, Tongjun, Gianola, Daniel S., Kim, Hyosim, Li, Nan, Fensin, Saryu, Boyce, Brad L., Rupert, Timothy J.
Formato: Preprint
Publicado: 2026
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author Hessong, Esther C.
della Ventura, Nicolo Maria
Niu, Tongjun
Gianola, Daniel S.
Kim, Hyosim
Li, Nan
Fensin, Saryu
Boyce, Brad L.
Rupert, Timothy J.
author_facet Hessong, Esther C.
della Ventura, Nicolo Maria
Niu, Tongjun
Gianola, Daniel S.
Kim, Hyosim
Li, Nan
Fensin, Saryu
Boyce, Brad L.
Rupert, Timothy J.
contents Amorphous grain boundary complexions have been shown to increase the plasticity of nanocrystalline alloys as compared to ordered grain boundaries. Here, the effect of an important structural descriptor, amorphous complexion thickness, on the plasticity and failure modes of nanocrystalline Cu-Zr is studied with in-situ compression testing, with over 50 micropillars tested. Two model materials were created that differ only in their complexion thickness, with one having a thicker complexion population than the other. The sample with thinner complexions was more likely to experience non-uniform plastic deformation in the form of localized plastic flow or shear banding. In contrast, the sample with thicker complexions displayed more homogeneous plasticity and higher damage tolerance; thicker amorphous complexions suppress localization by absorbing defects. This work demonstrates that increasing complexion thickness can be beneficial for stable plastic flow in nanocrystalline alloys, by improving resistance to strain localization and premature failure.
format Preprint
id arxiv_https___arxiv_org_abs_2601_18059
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Thicker amorphous grain boundary complexions reduce plastic strain localization in nanocrystalline Cu-Zr
Hessong, Esther C.
della Ventura, Nicolo Maria
Niu, Tongjun
Gianola, Daniel S.
Kim, Hyosim
Li, Nan
Fensin, Saryu
Boyce, Brad L.
Rupert, Timothy J.
Materials Science
Amorphous grain boundary complexions have been shown to increase the plasticity of nanocrystalline alloys as compared to ordered grain boundaries. Here, the effect of an important structural descriptor, amorphous complexion thickness, on the plasticity and failure modes of nanocrystalline Cu-Zr is studied with in-situ compression testing, with over 50 micropillars tested. Two model materials were created that differ only in their complexion thickness, with one having a thicker complexion population than the other. The sample with thinner complexions was more likely to experience non-uniform plastic deformation in the form of localized plastic flow or shear banding. In contrast, the sample with thicker complexions displayed more homogeneous plasticity and higher damage tolerance; thicker amorphous complexions suppress localization by absorbing defects. This work demonstrates that increasing complexion thickness can be beneficial for stable plastic flow in nanocrystalline alloys, by improving resistance to strain localization and premature failure.
title Thicker amorphous grain boundary complexions reduce plastic strain localization in nanocrystalline Cu-Zr
topic Materials Science
url https://arxiv.org/abs/2601.18059