Towards Self-Optimizing Electron Microscope: Robust Tuning of Aberration Coefficients via Physics-Aware Multi-Objective Bayesian Optimization

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pratiush, Utkarsh, Houston, Austin, Liu, Richard, Duscher, Gerd, Kalinin, Sergei
Format:	Preprint
Published:	2026
Subjects:	Machine Learning Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2601.18972