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Towards Self-Optimizing Electron Microscope: Robust Tuning of Aberration Coefficients via Physics-Aware Multi-Objective Bayesian Optimization

Fuente: arXiv

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Bibliographische Detailangaben
Hauptverfasser:	Pratiush, Utkarsh, Houston, Austin, Liu, Richard, Duscher, Gerd, Kalinin, Sergei
Format:	Preprint
Veröffentlicht:	2026
Schlagworte:	Machine Learning Materials Science
Online-Zugang:	Acceder al recurso
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

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