van Hulst, J. S., Franken, E. M., Janssen, B. J., Heemels, W. P. M. H., & Antunes, D. J. (2026). Tilt-based Aberration Estimation in Transmission Electron Microscopy.
Citazione stile Chigago Style (17a edizione)van Hulst, Jilles S., Erik M. Franken, Bart J. Janssen, W. P. M. H. Heemels, e Duarte J. Antunes. Tilt-based Aberration Estimation in Transmission Electron Microscopy. 2026.
Citatione MLA (9a ed.)van Hulst, Jilles S., et al. Tilt-based Aberration Estimation in Transmission Electron Microscopy. 2026.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.